ISSCC · 2022–2026 LIVE
Delft University of Technology
対象論文Papers 57 · 筆頭著者first author 48 · 著者按分fractional 40.44 · 世界World #4
所属著者Affiliated authors
ORCID が一致する著者は同一人物としてまとめています。それ以外は表記ごとに別人として扱います。Authors sharing an ORCID are merged; other spellings are listed separately.
| 順位Rank | 著者Author | 論文数Papers |
|---|---|---|
| 1 | ORCID | 18 |
| 2 | ORCID | 15 |
| 3 | ORCID | 9 |
| 3 | ORCID | 9 |
| 5 | ORCID | 6 |
| 6 | ORCID | 5 |
| 6 | ORCID | 5 |
| 6 | ORCID | 5 |
| 9 | ORCID | 4 |
| 9 | ORCID | 4 |
| 11 | ORCID | 3 |
| 11 | ORCID | 3 |
| 11 | ORCID | 3 |
| 11 | ORCID | 3 |
| 11 | ORCID | 3 |
| 11 | ORCID | 3 |
| 11 | ORCID | 3 |
| 11 | 3 | |
| 19 | 2 | |
| 19 | ORCID | 2 |
| 19 | 2 | |
| 19 | ORCID | 2 |
| 19 | 2 | |
| 19 | ORCID | 2 |
| 19 | ORCID | 2 |
| 19 | ORCID | 2 |
| 19 | 2 | |
| 19 | 2 | |
| 19 | ORCID | 2 |
| 19 | ORCID | 2 |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | ORCID | 1 |
| 31 | ORCID | 1 |
| 31 | ORCID | 1 |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | ORCID | 1 |
| 31 | ORCID | 1 |
| 31 | ORCID | 1 |
| 31 | 1 | |
| 31 | 1 | |
| 31 | ORCID | 1 |
| 31 | ORCID | 1 |
| 31 | 1 |
対象論文Papers
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology · IBM
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DOI
Chinese University of Hong Kong, Shenzhen · Southern University of Science and Technology · Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Imec the Netherlands · Delft University of Technology
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DOI
Delft University of Technology · Zhejiang University
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology · University of California San Diego
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DOI
Delft University of Technology · Iowa State University
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DOI
University of Science and Technology of China · Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology · Stanford University · University of Hawaiʻi at Mānoa · University of Hawaii System
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DOI
Delft University of Technology · Tsinghua University
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DOI
Delft University of Technology
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DOI
Tsinghua University · Delft University of Technology
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DOI
Delft University of Technology · Fudan University
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DOI
Delft University of Technology · Fraunhofer Institute for Reliability and Microintegration
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DOI
Delft University of Technology · Huazhong University of Science and Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology · QuTech
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DOI
QuTech · Delft University of Technology
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DOI
Tsinghua University · Delft University of Technology
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DOI
Zhejiang University · Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Southern University of Science and Technology · Chinese University of Hong Kong, Shenzhen · Tsinghua University · Delft University of Technology
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DOI
Delft University of Technology
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DOI
Imec the Netherlands · Delft University of Technology · IMEC
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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23.2 A 40A Shunt-Based Current Sensor with ±0.2% Gain Error from −40°C to 125°C and Self-CalibrationDOIDelft University of Technology · ミライズテクノロジーズMIRISE Technologies
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DOI
Delft University of Technology · Infineon
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DOI
Delft University of Technology · Tsinghua University
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DOI
Delft University of Technology · Tsinghua University
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology · Tsinghua University
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DOI
Delft University of Technology
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DOI
QuTech · Delft University of Technology · Intel
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DOI
Delft University of Technology · Erasmus MC
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DOI
Imec the Netherlands · Delft University of Technology · Eindhoven University of Technology · IMEC
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DOI
Delft University of Technology
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DOI
Delft University of Technology · University College Dublin · ソニーSony
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DOI
Delft University of Technology
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DOI
NXP · Eindhoven University of Technology · Delft University of Technology
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DOI
Delft University of Technology
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DOI
Delft University of Technology · Erasmus MC
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DOI
Delft University of Technology · ミライズテクノロジーズMIRISE Technologies