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企業・研究機関Company / Institute · オランダNetherlands · 2022–2026 LIVE

Holst Centre (Netherlands)

世界World 28位 (0 pt) · 対象論文Papers 5

年別の推移Papers per year

会議・論文誌別の論文数(フルカウント)Papers per venue (full count)

0122022 JSSC: 2220222023 ISSCC: 12023 JSSC: 1220232024 ESSERC: 11202420252026
ISSCCJSSCESSERC
数値表を表示Show table
会議・論文誌Venue20222023202420252026
ISSCC–1–––
JSSC21–––
ESSERC––1––

会議・論文誌別By venue

順位はフルカウントでの値です。Ranks use the full count.

会議・論文誌VenueフルFull 筆頭First按分Frac. 順位Rank
ISSCC Tier 1100.33世界World #77
VLSI Tier 1000.00–
JSSC Tier 1300.63世界World #47
CICC Tier 2000.00–
A-SSCC Tier 2000.00–
ESSERC Tier 2100.17世界World #41

対象論文Papers

太字はこの機関の所属として確認できた著者です。Bold: authors affiliated with this institution.

  1. ESSERC
    2024
    A 170mV-to-1.8V Input Voltage Range DC-DC Boost Converter Using a 100nH Air-coil with Sub-μA Quiescent Current
    DOI
    Wenxiang Yu, Stefano Stanzione, Christina Avdikou, Chris Van Hoof, Georges Gielen, Nick Van Helleputte
    KU Leuven · Holst Centre (Netherlands) · IMEC
  2. ISSCC
    2023
    21.2 A $\boldsymbol{22\mu \mathrm{W}}$ Peak Power Multimodal Electrochemical Sensor Interface IC for Bioreactor Monitoring
    DOI
    Qiuyang Lin, Wim Sijbers, Christina Avdikou, Didac Gomez, Dwaipayan Biswas, Sneha Sneha, Anastasios Malissovas, Bernardo Tacca, Nick Van Helleputte
    IMEC · MPS España · Holst Centre (Netherlands)
  3. JSSC
    2023
    An EMG Interface Comprising a Flexible a-IGZO Active Electrode Matrix and a 65-nm CMOS IC
    DOI
    Enrico Genco, Carmine Garripoli, Jan-Laurens P. J. van der Steen, Gerwin H. Gelinck, Sahel Abdinia, Pieter Harpe, Eugenio Cantatore
    Eindhoven University of Technology · Holst Centre (Netherlands)
  4. JSSC
    2022
    A 103-dB SFDR Calibration-Free Oversampled SAR ADC With Mismatch Error Shaping and Pre-Comparison Techniques
    DOI
    Yuting Shen, Hanyue Li, Haoming Xin, Eugenio Cantatore, Pieter Harpe
    Eindhoven University of Technology · Holst Centre (Netherlands)
  5. JSSC
    2022
    A 7.3-μ W 13-ENOB 98-dB SFDR Noise-Shaping SAR ADC With Duty-Cycled Amplifier and Mismatch Error Shaping
    DOI
    Hanyue Li, Yuting Shen, Haoming Xin, Eugenio Cantatore, Pieter Harpe
    Eindhoven University of Technology · Holst Centre (Netherlands)