企業・研究機関Company / Institute · インドIndia · 2022–2026 LIVE

STMicroelectronics

世界World 28位 (0 pt) · 対象論文Papers 6

年別の推移Papers per year

会議・論文誌別の論文数（フルカウント）Papers per venue (full count)

ISSCCVLSIJSSCCICCESSERC

数値表を表示Show table

会議・論文誌Venue	2022	2023	2024	2025	2026
ISSCC	–	1	–	–	1
VLSI	–	1	–	–	–
JSSC	1	–	–	–	–
CICC	–	–	–	–	1
ESSERC	1	–	–	–	–

会議・論文誌別By venue

順位はフルカウントでの値です。Ranks use the full count.

会議・論文誌Venue	フルFull	筆頭First	按分Frac.	順位Rank
ISSCC Tier 1	2	0	0.76	世界World #52
VLSI Tier 1	1	0	0.35	世界World #48
JSSC Tier 1	1	1	0.17	世界World #99
CICC Tier 2	1	1	0.89	世界World #22
A-SSCC Tier 2	0	0	0.00	–
ESSERC Tier 2	1	0	0.07	世界World #41

対象論文Papers

太字はこの機関の所属として確認できた著者です。Bold: authors affiliated with this institution.

CICC
2026

A 1.16GHz -160.4dBFS/Hz-NSD multi-bit Continuous-Time Delta-Sigma ADC Achieving SNR/SNDR of 86dB/83dB in 17.5MHz-BW without DAC calibration
DOI
Vaibhav Garg, Paras Garg, Ankur Bal, Sanyam Jain, Frederic Paillardet, Kallol Chatterjee, Chandrajit Debnath, Gauri Mittal, Anand Kumar

STMicroelectronics · STMicroelectronics
ISSCC
2026

17.2 the STM32N6 Microcontroller: Enabling Intelligent Edge AI for IoT and Beyond
DOI
G. Desoli, J-F. Agaësse, N. Chawla, E. Hilkens, T. Boesch, V. Taufour, M. Ayodhyawasi, P. Ravenhill, S. Pal-Singh, M. Soulie

STMicroelectronics · STMicroelectronics · STMicroelectronics · STMicroelectronics
ISSCC
2023

16.7 A 40-310TOPS/W SRAM-Based All-Digital Up to 4b In-Memory Computing Multi-Tiled NN Accelerator in FD-SOI 18nm for Deep-Learning Edge Applications
DOI
Giuseppe Desoli, Nitin Chawla, Thomas Boesch, Manui Avodhyawasi, Harsh Rawat, Hitesh Chawla, VS Abhijith, Paolo Zambotti, Akhilesh Sharma, Carmine Cappetta, Michele Rossi, Antonio De Vita, Francesca Girardi

STMicroelectronics · STMicroelectronics · STMicroelectronics
VLSI
2023

ASIL-D automotive-grade microcontroller in 28nm FD-SOI with full-OTA capable 21MB embedded PCM memory and highly scalable power management
DOI
N. Grossier, F. Disegni, A. Ventre, A. Barcella, R. Mariani, V. Marino, S. Mazzara, A. Scavuzzo, M. Bansal, B. Soni, A. Anand, S. Banzal, D. Joshi, R. Narwal, M. Niranjani, K. Trivedi, P. Ferreira, R. Ranica, L. Vullo, A. Cathelin, A. Maurelli, S. Pezzini, M. Peri

STMicroelectronics · STMicroelectronics
ESSERC
2022

An Extended Temperature Range ePCM Memory in 90-nm BCD for Smart Power Applications
DOI
M. Carissimi, C. Auricchio, E. Calvetti, L. Capecchi, M. Torres, S. Zanchi, P. Gupta, R. Zurla, A. Cabrini, D. Gallinari, F. Disegni, M. Borghi, E. Palumbo, A. Redaelli, M. Pasotti

STMicroelectronics · STMicroelectronics · University of Pavia
JSSC
2022

Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing
DOI
Abhishek Jain, Andrea Mario Veggetti, Dennis Crippa, Antonio Benfante, Simone Gerardin, Marta Bagatin

STMicroelectronics · STMicroelectronics · University of Padua