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企業・研究機関Company / Institute · インドIndia · 2022–2026 LIVE

Texas Instruments

世界World 28位 (0 pt) · 対象論文Papers 5

年別の推移Papers per year

会議・論文誌別の論文数（フルカウント）Papers per venue (full count)

012320222023 ISSCC: 22023 A-SSCC: 1320232024 ISSCC: 1120242025 JSSC: 1120252026
ISSCCJSSCA-SSCC
数値表を表示Show table
会議・論文誌Venue20222023202420252026
ISSCC–21––
JSSC–––1–
A-SSCC–1–––

会議・論文誌別By venue

順位はフルカウントでの値です。Ranks use the full count.

会議・論文誌VenueフルFull 筆頭First按分Frac. 順位Rank
ISSCC Tier 1332.06世界World #42
VLSI Tier 1000.00–
JSSC Tier 1100.75世界World #99
CICC Tier 2000.00–
A-SSCC Tier 2110.50世界World #25
ESSERC Tier 2000.00–

対象論文Papers

太字はこの機関の所属として確認できた著者です。Bold: authors affiliated with this institution.

  1. JSSC
    2025
    A 119-dBA Dynamic Range, 3.3-mW Audio CTDSM With a Class-B Resistor DAC and Continuous-Time Quantizer
    DOI
    Anand Subramanian, Tanmay Halder, Laxmi Vivek Tripurari, Anand Kannan
    Texas Instruments · Texas Instruments
  2. ISSCC
    2024
    9.5 A 118.5dBA DR 3.3mW Audio ADC with a Class-B Resistor DAC, Non-Overlap DEM and Continuous-Time Quantizer
    DOI
    Anand Subramanian, Tanmay Halder, Laxmi Vivek Tripurari, Anand Kannan
    Texas Instruments
  3. A-SSCC
    2023
    A Triple-Band Radio for WLAN 11b/g/n/ax in 45nm CMOS
    DOI
    D Sahu, V Srinivas, R Chatterjee, M Agrawal, P Agrawal, R Juluri, M. Mukherjee, Vimal E, A. Yerramsetty, G Bakalzuk, O Rahmanony, K Rajmohan, A Sancheti, R Anand
    Texas Instruments · Texas Instruments
  4. ISSCC
    2023
    A 0.5-to-400MHz Programmable BAW Oscillator with Fractional Output Divider Achieving 4ppm Frequency Stability over Temperature and <95fs Jitter
    DOI
    Subhashish Mukherjee, Yogesh Darwhekar, Jayawardan Janardhanan, Peeyoosh Mirajkar, Raghavendra Reddy, Harish Ramesh, Bichoy Bahr, Jagdish Chand, Uday Meda, Baher Haroun, Shankar Karantha, Ernest Yen, Keegan Martin, Daniel Gan, Amin Sijelmassi, Sankaran Aniruddhan
    Texas Instruments · Texas Instruments · Indian Institute of Technology Madras
  5. ISSCC
    2023
    Bandpass Filter and Oscillator ICs with THD < -140dBc at 10Vppd for Testing High-Resolution ADCs
    DOI
    Subha Sarkar, Rajat Agarwal, Nagendra Krishnapura
    Indian Institute of Technology Madras · Texas Instruments